Channeling analysis in studying ion irradiation damage in materials containing various types of defects

Ke Jin, Gihan Velisa, Haizhou Xue, Taini Yang, Hongbin Bei, William J. Weber, Lumin Wang, Yanwen Zhang*

*此作品的通讯作者

科研成果: 期刊稿件文章同行评审

20 引用 (Scopus)

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Material Science

Engineering

Chemistry