Automatic identification of clue cells in microscopic leucorrhea images based on texture features and combination of kernel functions of SVM

Ruqian Hao*, Lin Liu, Xiangzhou Wang, Jing Zhang, Xiaohui Du, Yong Liu

*此作品的通讯作者

科研成果: 书/报告/会议事项章节会议稿件同行评审

摘要

Automatic identification of clue cells in microscopic leucorrhea images provides important information for evaluating gynecological diseases. Traditional manual microscopic examination of Gram-stained vaginal smears is adopted by most hospitals for identifying clue cells; however, it is both complex and time-consuming. In order to solve these problems, an automatic identification of clue cells in microscopic leucorrhea images based on machine learning is proposed in this paper. First, the Otsu threshold method is used to segment regions of interest (ROI) in image preprocessing according to the morphological features of clue cells. Then, Gabor, HOG and GLCM texture features are extracted to describe irregular edges and rough surfaces of clue cells. Finally, a SVM classifier using a hybrid kernel function by linearly weighted RBF and polynomial kernels is trained to identify clue cells rapidly and conveniently. In experiments, the method using GLCM texture features and a hybrid kernel function of SVM achieved 94.64% accuracy and 94.92% recall rate, which was better than methods using Gabor or HOG texture features and a single kernel function of SVM.

源语言英语
主期刊名9th International Symposium on Advanced Optical Manufacturing and Testing Technology
主期刊副标题Optoelectronic Materials and Devices for Sensing and Imaging
编辑Xiaoliang Ma, Yadong Jiang, Bernard Kippelen, Mingbo Pu, Xue Feng, Xiong Li
出版商SPIE
ISBN(电子版)9781510623286
DOI
出版状态已出版 - 2019
已对外发布
活动9th International Symposium on Advanced Optical Manufacturing and Testing Technology: Optoelectronic Materials and Devices for Sensing and Imaging - Chengdu, 中国
期限: 26 6月 201829 6月 2018

出版系列

姓名Proceedings of SPIE - The International Society for Optical Engineering
10843
ISSN(印刷版)0277-786X
ISSN(电子版)1996-756X

会议

会议9th International Symposium on Advanced Optical Manufacturing and Testing Technology: Optoelectronic Materials and Devices for Sensing and Imaging
国家/地区中国
Chengdu
时期26/06/1829/06/18

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