Automatic detection of defect positions including interface dislocations and strain measurement in Ge/Si heterostructure from moiré phase processing of TEM image

Qinghua Wang*, Shien Ri, Peng Xia, Zhanwei Liu

*此作品的通讯作者

科研成果: 期刊稿件 › 文章 › 同行评审

14 引用 （Scopus）

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Engineering

Material Science

Chemical Engineering