Al2O3 and SiO2 Atomic Layer Deposition Layers on ZnO Photoanodes and Degradation Mechanisms

Qian Cheng, Manpuneet K. Benipal, Qianlang Liu, Xingye Wang, Peter A. Crozier, Candace K. Chan*, Robert J. Nemanich

*此作品的通讯作者

科研成果: 期刊稿件文章同行评审

29 引用 (Scopus)

指纹

探究 'Al2O3 and SiO2 Atomic Layer Deposition Layers on ZnO Photoanodes and Degradation Mechanisms' 的科研主题。它们共同构成独一无二的指纹。

Engineering

Material Science