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王 允
光电学院
h-index
751
引用
14
H-指数
根据储存在 Pure 的刊物以及来自 Scopus 的引用文献数量计算
2011
2024
每年的科研成果
概览
指纹图谱
合作网络
科研成果
(124)
相似学者
(8)
指纹图谱
深入其中 Yun Wang 为活跃的研究主题。这些主题标签来自此人的成果。它们共同形成唯一的指纹。
分类
加权
按字母排序
Engineering
Confocal Microscopy
100%
Measurement System
65%
Experimental Result
64%
Surface Profile
43%
Axial Resolution
41%
Obtains
35%
Focal Length
33%
High Resolution
31%
Outer Surface
30%
Spherical Surface
29%
Larger Aperture
24%
Refractive Index
22%
Geometric Parameter
21%
Response Curve
21%
Received Power
20%
Optical Systems
20%
Lateral Resolution
19%
Shell Thickness
17%
Lens Thickness
16%
Image Restoration
16%
Microstructure
16%
Two Dimensional
15%
Signal-to-Noise Ratio
13%
Reflected Light
13%
Microelectromechanical System
13%
Measurement Uncertainty
13%
Atomic Force Microscope
13%
Resonator
13%
Confocal Microscope
13%
Measurement Range
12%
Spatial Resolution
11%
Focal Point
11%
Defects
11%
Surface Defect
11%
Numerical Aperture
11%
Optical Axis
10%
Simplifies
10%
Image Analysis
10%
Random Error
10%
Displacement Sensor
10%
Nanometre
10%
Test Point
10%
Imaging Systems
9%
Repeatability
9%
Resolution Image
9%
Sampling Point
9%
Phase Shift
8%
Spherical Mirror
8%
Key Parameter
8%
Gas Bearing
8%
Physics
Measurement Method
94%
Inertial Confinement Fusion
48%
High Resolution
45%
Collimator
33%
Interferometry
32%
Numerical Aperture
31%
Optical Path
26%
Time Measurement
24%
Raman Spectroscopy
22%
Optical Phase Shifting Interferometry
20%
Laser Fusion
20%
Luminous Intensity
20%
Tomography
18%
Signal-to-Noise Ratio
18%
Rangefinding
16%
Optical Measurement
15%
Zero-Temperature
13%
Systems Stability
13%
Piezoelectricity
13%
Data Transmission
10%
Brillouin Scattering
10%
Refractivity
10%
Curve Fitting
8%
Optical Device
8%
Random Error
8%
Raman Spectra
7%
Polarized Light
7%
Design Optimization
6%
Birefringence
6%
In Situ Measurement
6%
Wavelet Analysis
6%
Light Beams
6%
Cell Imaging
6%
Systems Integration
6%
Instrument Calibration
6%
Surface Defect
6%
Laser Method
6%
Optics
6%
Transducer
6%
Wavelet
6%
Error Analysis
6%
Visible Spectrum
6%
Optical Communication
6%
Microelectromechanical System
6%
Line of Sight
6%
First-Principles
6%
System Identification
6%
Nanoscale
6%
Elastic Scattering
6%
Image Analysis
6%
