X-Ray Detector Based on All-Inorganic Lead-Free Cs2AgBiBr6 Perovskite Single Crystal

Hainan Zhang, Ziyan Gao, Renrong Liang*, Xinran Zheng, Xiangshun Geng, Yunfei Zhao, Dan Xie, Jiawang Hong, He Tian, Yi Yang, Xueyun Wang, Tian Ling Ren

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

64 Citations (Scopus)

Abstract

In this paper, single crystals (SCs) of the Cs2AgBiBr6 double perovskite were grown using the method of crystallization from a supersaturated solution. It was shown that the natural crystal growth surface of the perovskite with perfect crystal quality is along the (111) plane by X-ray diffraction (XRD) and high-resolution transmission electron microscope (HRTEM) analyses. The fabricated high-sensitivity X-ray detector based on the Cs2AgBiBr6 SCs with vertical structure achieved detection sensitivity up to 316μ CGyair-1 cm-2 under bias voltage of 18 V. Furthermore, the frequency noise characteristics of the device under different posttreatment processes were systematically analyzed, which indicated that the combination of thermal annealing and isopropanol rinsing can suppress field-driven ion migration and surface conduction channel, thereby increasing the resistivity of the perovskite material and reducing the noise current of the device. Our results revealed that the Cs2AgBiBr6 SCs-based X-ray detector with high sensitivity and low cost has a great potential for application in manufacturing lead-free and stable radiation detection electronics in the future.

Original languageEnglish
Article number8675747
Pages (from-to)2224-2229
Number of pages6
JournalIEEE Transactions on Electron Devices
Volume66
Issue number5
DOIs
Publication statusPublished - May 2019
Externally publishedYes

Keywords

  • Cs AgBiBr X-ray detector
  • lead-free perovskite
  • noise characteristics
  • radiation detection electronics

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