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Unified approach for simulation of statistical reliability in nanoscale CMOS transistors from devices to circuits
A. Asenov, J. Ding, D. Reid, P. Asenov, S. Amoroso, F. Adamu-Lema, L. Gerrer
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review
8
Citations
(Scopus)