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Thickness-Dependent In-Plane Polarization and Structural Phase Transition in van der Waals Ferroelectric CuInP2S6
Jianming Deng, Yanyu Liu, Mingqiang Li, Sheng Xu, Yingzhuo Lun, Peng Lv, Tianlong Xia, Peng Gao*, Xueyun Wang, Jiawang Hong
*Corresponding author for this work
Research output: Contribution to journal › Article › peer-review
60
Citations
(Scopus)