The development of a dual-warhead impact system for dynamic linearity measurement of a high-g micro-electro-mechanical-systems (MEMS) accelerometer

Yunbo Shi, Zhicai Yang, Zongmin Ma*, Huiliang Cao, Zhiwei Kou, Dan Zhi, Yanxiang Chen, Hengzhen Feng, Jun Liu

*Corresponding author for this work

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