System Reliability Analysis of MEMS Gyroscope with Multiple Failure Modes

Hengzhen Feng, Wenzhong Lou, Dakui Wang, Fuquan Zheng, Maohao Liao

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Aiming at the limitation of traditional MEMS gyroscope reliability analysis method, this paper presents a reliability calculation method for MEMS gyroscope about failure mechanism, failure process and failure mode correlation. The problem which the MEMS gyroscope is easy to be affected by technology, structure, gap, material and so on, the failure mechanism is complex, the reliability data is short and the reliability is difficult to predict are solved. The system reliability of MEMS gyroscope is estimated. Through the calculation and analysis among much reliability analysis method, G-PCM method is confirmed. The reliability of the MEMS gyroscope is calculated to be 0.999169, which can meet the requirements of the reliability of the key products.

Original languageEnglish
Title of host publication10th International Conference on Modelling, Identification and Control, ICMIC 2018
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781538654163
DOIs
Publication statusPublished - 9 Nov 2018
Event10th International Conference on Modelling, Identification and Control, ICMIC 2018 - Guiyang, China
Duration: 2 Jul 20184 Jul 2018

Publication series

Name10th International Conference on Modelling, Identification and Control, ICMIC 2018

Conference

Conference10th International Conference on Modelling, Identification and Control, ICMIC 2018
Country/TerritoryChina
CityGuiyang
Period2/07/184/07/18

Keywords

  • MEMS gyroscope
  • failure mechanism
  • failure mode correlation
  • failure process
  • reliability analysis method

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