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Synergistic effects in MOS capacitors with an Au/HfO2-SiO2/Si structure irradiated with neutron and gamma ray
Jianmin Shi, Xinwei Wang, Xiuyu Zhang, Jianming Xue*, Xun Guo, Man Li, Jialiang Wang, Xianfu Meng, Bo Cui, Xiaofei Yu, Lei Yu, Wenxiang Jiang, Shuming Peng*
*Corresponding author for this work
Research output: Contribution to journal › Article › peer-review
2
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(Scopus)