Structure evolution of the interfacial layer of BaTiO3 thin films during annealing process and related good resistive switching behaviors

Zixiong Sun*, Sizhao Huang*, Wenxuan Zhu, Yorick A. Birkhölzer, Xing Gao, Romar Angelo Avila, Houbing Huang*, Xiaojie Lou, Evert P. Houwman, Minh D. Nguyen*, Gertjan Koster, Guus Rijnders*

*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

7 Citations (Scopus)

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