Stress field and damage evolution in C/SiC woven composites: Image-based finite element analysis and in situ X-ray computed tomography tests

Shigang Ai, Weili Song, Yanfei Chen*

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

43 Citations (Scopus)

Fingerprint

Dive into the research topics of 'Stress field and damage evolution in C/SiC woven composites: Image-based finite element analysis and in situ X-ray computed tomography tests'. Together they form a unique fingerprint.

Engineering

Material Science