Reliability analysis for degradation and shock process based on truncated normal distribution

Engineering

• Degradation Process 50%
• Degradation Rate 50%
• Metal-Oxide-Semiconductor Field-Effect Transistor 50%
• Normal Distribution 100%
• Performance Degradation 50%
• Random Variable ξ 50%
• Reliability Analysis 100%
• Reliability Engineering 50%
• Shock Loads 50%

Mathematics

• Degradation Rate 50%
• Gaussian Distribution 100%
• Markov Chain Monte Carlo 50%
• Random Variable 50%
• Wiener Process 50%