Abstract
An external cavity semiconductor laser interferometer used to measure far distance micro-vibration in real time is proposed. In the interferometer, a single longitudinal mode and excellent coherent characteristic grating external cavity semiconductor laser is constructed and acted as a light source and a phase compensator. Its coherent length exceeds 200 meters. The angle between normal and incidence beam of the far object is allowed to change in definite range during the measurement with this interferometer, and this makes the far distance interference measurement easier and more convenient. Also, it is not required to keep the amplitudes of the first and second harmonic components equal, and then the dynamic range is increased. A feedback control system is used to compensate the phase disturbance between the two interference beams introduced by environmental vibration.
| Original language | English |
|---|---|
| Pages (from-to) | 770-774 |
| Number of pages | 5 |
| Journal | Proceedings of SPIE - The International Society for Optical Engineering |
| Volume | 4927 |
| DOIs | |
| Publication status | Published - 20 Sept 2002 |
| Externally published | Yes |
| Event | Optical Design and Testing 2002 - Shanghai, China Duration: 14 Oct 2002 → 18 Oct 2002 |
Keywords
- External cavity semiconductor laser interferometer
- Far distance
- Feedback control
- Micro-vibration measurement