Real-Space Imaging of Carrier Dynamics of Materials Surfaces by Second-Generation Four-Dimensional Scanning Ultrafast Electron Microscopy

Engineering

• Real Space 100%
• Material Surface 100%
• Demonstrates 66%
• Nanometre 66%
• Secondary Electrons 66%
• Surface Morphology 33%
• Determines 33%
• Photovoltaics 33%
• Spatial Resolution 33%
• Defects 33%
• Energy Conversion Efficiency 33%
• Nanoscale 33%
• Energy Dissipation 33%
• Optical Pulse 33%
• Temporal Resolution 33%
• Photocatalysis 33%
• Fundamental Process 33%

Material Science

• Electron Microscopy 100%
• Density 50%
• Surface Morphology 50%
• Photovoltaics 50%
• Photocatalysis 50%

Physics

• Electron Microscopy 100%
• Nanoscale 50%
• Electron Beam 50%
• Holes (Electron Deficiencies) 50%