Quantifying Electric Vehicle Battery's Ohmic Resistance Increase Caused by Degradation from On-board Data

Jie Fan, Yuan Zou*, Xudong Zhang

*Corresponding author for this work

Research output: Contribution to journalConference articlepeer-review

14 Citations (Scopus)

Fingerprint

Dive into the research topics of 'Quantifying Electric Vehicle Battery's Ohmic Resistance Increase Caused by Degradation from On-board Data'. Together they form a unique fingerprint.

Engineering