Pile-up effect in near-infrared single-pixel imaging with an incoherent light source

Wei Zhang, Shi Jian Li, Xiao Peng Jin, Xu Ri Yao

Research output: Contribution to journalArticlepeer-review

Abstract

Single-pixel imaging (SPI), which offers high-throughput measurement capabilities and a simple structure, has promising applications in near-infrared single-photon imaging. Nevertheless, the low saturation count rate of near-infrared single-photon detectors often leads to photon pile-up effects. This paper delves into the influence of these effects on passive SPI under both random matrix modulation and Hadamard matrix modulation and offers corresponding noise removal solutions. The experimental results validated the efficacy of these noise removal schemes.

Original languageEnglish
Pages (from-to)37369-37381
Number of pages13
JournalOptics Express
Volume32
Issue number21
DOIs
Publication statusPublished - 7 Oct 2024

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