Nondestructive ion trap mass analysis at high pressure

Wei Xu; Jeffrey B. Maas; Frank J. Boudreau; William J. Chappell; Zheng Ouyang

doi:10.1021/ac1027808

Nondestructive ion trap mass analysis at high pressure

Wei Xu, Jeffrey B. Maas, Frank J. Boudreau, William J. Chappell, Zheng Ouyang^*

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

13 Citations (Scopus)

Abstract

A method for performing nondestructive ion trap mass analysis at high pressures (>1 mTorr) has been developed using image current measurement with constant dipolar excitation. Instead of monitoring the ion secular motion, a harmonic of the ion motion was used for narrow band image current measurement followed by Fourier Transform. The capability of this technique has been demonstrated with mass analysis using a single measurement at pressures of 10 mTorr or higher. Methods for mixture analysis and tandem mass spectrometry have also been developed for nondestructive mass analysis.

Original language	English
Pages (from-to)	685-689
Number of pages	5
Journal	Analytical Chemistry
Volume	83
Issue number	3
DOIs	https://doi.org/10.1021/ac1027808
Publication status	Published - 1 Feb 2011
Externally published	Yes

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10.1021/ac1027808

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AU - Boudreau, Frank J.

AU - Chappell, William J.

AU - Ouyang, Zheng

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AB - A method for performing nondestructive ion trap mass analysis at high pressures (>1 mTorr) has been developed using image current measurement with constant dipolar excitation. Instead of monitoring the ion secular motion, a harmonic of the ion motion was used for narrow band image current measurement followed by Fourier Transform. The capability of this technique has been demonstrated with mass analysis using a single measurement at pressures of 10 mTorr or higher. Methods for mixture analysis and tandem mass spectrometry have also been developed for nondestructive mass analysis.

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Nondestructive ion trap mass analysis at high pressure

Abstract

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