Abstract
A method for performing nondestructive ion trap mass analysis at high pressures (>1 mTorr) has been developed using image current measurement with constant dipolar excitation. Instead of monitoring the ion secular motion, a harmonic of the ion motion was used for narrow band image current measurement followed by Fourier Transform. The capability of this technique has been demonstrated with mass analysis using a single measurement at pressures of 10 mTorr or higher. Methods for mixture analysis and tandem mass spectrometry have also been developed for nondestructive mass analysis.
Original language | English |
---|---|
Pages (from-to) | 685-689 |
Number of pages | 5 |
Journal | Analytical Chemistry |
Volume | 83 |
Issue number | 3 |
DOIs | |
Publication status | Published - 1 Feb 2011 |
Externally published | Yes |
Fingerprint
Dive into the research topics of 'Nondestructive ion trap mass analysis at high pressure'. Together they form a unique fingerprint.Cite this
Xu, W., Maas, J. B., Boudreau, F. J., Chappell, W. J., & Ouyang, Z. (2011). Nondestructive ion trap mass analysis at high pressure. Analytical Chemistry, 83(3), 685-689. https://doi.org/10.1021/ac1027808