Interpreting nanovoids in atom probe tomography data for accurate local compositional measurements

Xing Wang*, Constantinos Hatzoglou, Brian Sneed, Zhe Fan, Wei Guo, Ke Jin, Di Chen, Hongbin Bei, Yongqiang Wang, William J. Weber, Yanwen Zhang, Baptiste Gault, Karren L. More, Francois Vurpillot, Jonathan D. Poplawsky

*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

41 Citations (Scopus)

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