Abstract
ZrB2 is interesting for thermal protection materials because of favorable thermal stability, mechanical properties and oxidation resistance. ZrB2-20 vol.% SiC composite was prepared by hot-pressing at 2000 °C and 30 MPa. Microstructures and interfacial characterization were investigated by high resolution transmission electron microscopy. SiC polytype was formed as 6H structure in hot-pressed ZrB2-SiC ceramics. Numerous edge dislocations were found in ZrB2 grains. There was no interfacial amorphous layer or transition layer at the ZrB2/6H-SiC interface. Note also that since only one of the constituents (ZrB2 or SiC) was oriented along a proper zone axis, no evident orientation relationship was observed between SiC or ZrB2.
Original language | English |
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Pages (from-to) | 341-343 |
Number of pages | 3 |
Journal | International Journal of Refractory Metals and Hard Materials |
Volume | 29 |
Issue number | 3 |
DOIs | |
Publication status | Published - May 2011 |
Externally published | Yes |
Keywords
- Defect
- Electron microscopy
- Interface
- ZrB-SiC ceramics