Interface and defect characterization in hot-pressed ZrB2-SiC ceramics

Jun Liang, Yu Wang*, Songhe Meng

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

10 Citations (Scopus)

Abstract

ZrB2 is interesting for thermal protection materials because of favorable thermal stability, mechanical properties and oxidation resistance. ZrB2-20 vol.% SiC composite was prepared by hot-pressing at 2000 °C and 30 MPa. Microstructures and interfacial characterization were investigated by high resolution transmission electron microscopy. SiC polytype was formed as 6H structure in hot-pressed ZrB2-SiC ceramics. Numerous edge dislocations were found in ZrB2 grains. There was no interfacial amorphous layer or transition layer at the ZrB2/6H-SiC interface. Note also that since only one of the constituents (ZrB2 or SiC) was oriented along a proper zone axis, no evident orientation relationship was observed between SiC or ZrB2.

Original languageEnglish
Pages (from-to)341-343
Number of pages3
JournalInternational Journal of Refractory Metals and Hard Materials
Volume29
Issue number3
DOIs
Publication statusPublished - May 2011
Externally publishedYes

Keywords

  • Defect
  • Electron microscopy
  • Interface
  • ZrB-SiC ceramics

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