Image-free classification via few-shot learning

Songbo Wan, Xuyang Chang, Liheng Bian*

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

In recent years, deep learning has exhibited remarkable performance in image classification. Nevertheless, traditional deep-learning-based techniques heavily depend on the availability of high-quality images for conveying information. This reliance results in the inefficient utilization of hardware and software resources across various stages, including image acquisition, storage, and processing. Additionally, these techniques often necessitate substantial amounts of data to effectively learn the underlying mapping, posing challenges in practical scenarios where acquiring a sufficient volume of paired data proves difficult. In this paper, we introduce a novel approach for image-free few-shot recognition by using a single-pixel detector. Our method comprises two fundamental stages. First, we design a neural network that integrates encoding and decoding modules, which can learn optimized encoding masks based on the statistical priors. Second, we employ these optimized masks to generate compressed 1D measurements. Subsequently, these measurements are fed into the classification network, preceded by the decoding module trained during the initial stage. The parameters of this decoding module serve as the initialization parameters for the subsequent stage of training. Furthermore, we incorporate a meta-training strategy, commonly used in few-shot classification, to mitigate dataset requirements during the second stage of training. Simulation results illustrate the effectiveness of our approach in image-free classification directly from 1D measurements, bypassing the time-consuming image reconstruction process. Our technique achieves a substantial reduction in data volume by two orders of magnitude while relying on only a limited number of paired data samples.

Original languageEnglish
Title of host publicationOptoelectronic Imaging and Multimedia Technology X
EditorsQionghai Dai, Tsutomu Shimura, Zhenrong Zheng
PublisherSPIE
ISBN (Electronic)9781510667839
DOIs
Publication statusPublished - 2023
EventOptoelectronic Imaging and Multimedia Technology X 2023 - Beijing, China
Duration: 15 Oct 202316 Oct 2023

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume12767
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Conference

ConferenceOptoelectronic Imaging and Multimedia Technology X 2023
Country/TerritoryChina
CityBeijing
Period15/10/2316/10/23

Keywords

  • Image-free classification
  • few-shot learning
  • single pixel detector

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