Evaluation of temperature and humidity on PV module degradation- in field degradation analysis of crystalline silicon module

Hailing Li, Fang Lv, Hongwei DIao, Xu Chen, Wenjing Wang

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

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Abstract

PV modules operated in humid and hot climate area in different sites with different operating years were investigated. The average degradation rate is 1.18%/y, higher than guarantee of 20% for 25 years (0.8%/y). By investigating modules from 3 plants operating for 3 years, 6 years and 15 years, the influence of operating year on degradation are studied. As reported before, corrosion of metallic materials is considered to be one of the main degradation models. We find linear relationship between FF and Pmax degradation, especially at the case with long operating year.

Original languageEnglish
Title of host publication2019 IEEE 46th Photovoltaic Specialists Conference, PVSC 2019
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages1986-1990
Number of pages5
ISBN (Electronic)9781728104942
DOIs
Publication statusPublished - Jun 2019
Externally publishedYes
Event46th IEEE Photovoltaic Specialists Conference, PVSC 2019 - Chicago, United States
Duration: 16 Jun 201921 Jun 2019

Publication series

NameConference Record of the IEEE Photovoltaic Specialists Conference
ISSN (Print)0160-8371

Conference

Conference46th IEEE Photovoltaic Specialists Conference, PVSC 2019
Country/TerritoryUnited States
CityChicago
Period16/06/1921/06/19

Keywords

  • Photovoltaic systems
  • degradation
  • module
  • silicon

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Li, H., Lv, F., DIao, H., Chen, X., & Wang, W. (2019). Evaluation of temperature and humidity on PV module degradation- in field degradation analysis of crystalline silicon module. In 2019 IEEE 46th Photovoltaic Specialists Conference, PVSC 2019 (pp. 1986-1990). Article 8981241 (Conference Record of the IEEE Photovoltaic Specialists Conference). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/PVSC40753.2019.8981241