Abstract
The effect on RCS caused by surface roughness of the corner reflector is analyzed in this paper. The rough surface was modeled by Gaussian random surface and the scattering field was computed by full-wave numerical method (FE-BI-MLFMA). The numerical results agree well with the measured data, which clarifies the experimental data and validates the computation model. Several sets of numerical results show that the average RCS of the side-scattering region increases with the raise of root mean square height or the decrease of the correlation length of the random rough surface. When the height or the correlative length is changed to a certain degree, the RCS value of the main scattering region is also affected significantly. The conclusion of this paper is significant to the application in RCS calibration with corner reflector.
| Original language | English |
|---|---|
| Pages (from-to) | 1227-1230 |
| Number of pages | 4 |
| Journal | Beijing Ligong Daxue Xuebao/Transaction of Beijing Institute of Technology |
| Volume | 31 |
| Issue number | 10 |
| Publication status | Published - Oct 2011 |
Keywords
- Corner reflector
- Full-wave numerical method
- Gaussian random surface
- Radar cross section(RCS)