Effect of SiO2 nano-particles on adhesion strength of copper conductive adhesives

Tong Xiang Liang*, Wen You Ma, Mao Sheng Cao

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

5 Citations (Scopus)

Abstract

Copper conductive adhesives were prepared using epoxy as matrix, the mixture of m-phenylenediamine and diaminodiphenylmethane as hardener, and copper particles as the conducting filler. The effect of curing temperature, curing time, hardener content and SiO2 nano-particles on the adhesion strength was investigated. The adhesion strength reached 20 MPa when the adhesives cured at 145°C for 2 h. The adhesion strength increased to 25 MPa when the SiO2 nano-particles were doped. This result is attributed to the fact that SiO2 nano-particles disperses in the molecular chain of epoxy, which absorbs stress and energy, prevents the spreading of crack.

Original languageEnglish
Pages (from-to)225-228
Number of pages4
JournalGaofenzi Cailiao Kexue Yu Gongcheng/Polymeric Materials Science and Engineering
Volume21
Issue number1
Publication statusPublished - Jan 2005
Externally publishedYes

Keywords

  • Adhesion strength
  • Conductive adhesive
  • Nano-particles

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