Effect of charge coupled device integration time on the imaging quality of a micro imaging system

Research output: Contribution to journal › Article › peer-review

Original language	English
Pages (from-to)	338
Number of pages	1
Journal	Binggong Xuebao/Acta Armamentarii
Volume	24
Issue number	3
Publication status	Published - Aug 2003

Cite this

@article{dd242af9f21a41589468e5dfef10f198,

title = "Effect of charge coupled device integration time on the imaging quality of a micro imaging system",

author = "Yng Song and Qun Hao and Yongtian Wang",

year = "2003",

month = aug,

language = "English",

volume = "24",

pages = "338",

journal = "Binggong Xuebao/Acta Armamentarii",

issn = "1000-1093",

publisher = "China Ordnance Society",

number = "3",

}

TY - JOUR

T1 - Effect of charge coupled device integration time on the imaging quality of a micro imaging system

AU - Song, Yng

AU - Hao, Qun

AU - Wang, Yongtian

PY - 2003/8

Y1 - 2003/8

UR - http://www.scopus.com/inward/record.url?scp=0141908143&partnerID=8YFLogxK

M3 - Article

AN - SCOPUS:0141908143

SN - 1000-1093

VL - 24

SP - 338

JO - Binggong Xuebao/Acta Armamentarii

JF - Binggong Xuebao/Acta Armamentarii

IS - 3

ER -