Critical length scales for chemical heterogeneity at Cu/Nb 3D interfaces by atom probe tomography

Zezhou Li, Justin Y. Cheng, Jonathan D. Poplawsky*, Shuozhi Xu, Jon K. Baldwin, Irene J. Beyerlein, Nathan A. Mara

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

5 Citations (Scopus)

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