Skip to main navigation
Skip to search
Skip to main content
Beijing Institute of Technology Home
English
中文
Home
Profiles
Research units
Research output
Prizes
Search by expertise, name or affiliation
Application of cellular automata for very large scale integration test
Ying Wang
*
,
He Chen
*
Corresponding author for this work
School of Information and Electronics
Beijing Institute of Technology
Research output
:
Contribution to journal
›
Article
›
peer-review
1
Citation (Scopus)
Overview
Fingerprint
Fingerprint
Dive into the research topics of 'Application of cellular automata for very large scale integration test'. Together they form a unique fingerprint.
Sort by
Weight
Alphabetically
Computer Science
Integration Test
100%
Logic Simulation
16%
Fault Coverage
16%
Random Test
16%
Engineering
Fast Logic
50%