Analysis on Near Field Spatial Spectra Scattering Modeling of Metallic Nanoparticle and Microscopic Imaging

Guo Yan Liu, Kun Gao, Xue Feng Liu, Guo Qiang Ni

Research output: Contribution to journalArticlepeer-review

Abstract

Polarization parameters indirect microscopic imaging, which utilizes conventional microscope as a basic light path and inserts modulations into the light path, finally, the inversion images are obtained after fitting and filtering the data obtained from the system. By analyzing the near-field spatial spectra scattering around nanoparticles to solve spatial spectra scattering. Comparing polarization parameters indirect microscopic imaging with direct imaging by using FDTD modeling, it can be found that the resolution of polarization parameters indirect microscopic imaging is much higher than conventional imaging and it can not only detect the shape and electric field distribution of nanoparticles, but also obtain much wider spatial scattering spectra.

Original languageEnglish
Pages (from-to)2662-2666
Number of pages5
JournalGuang Pu Xue Yu Guang Pu Fen Xi/Spectroscopy and Spectral Analysis
Volume37
Issue number9
DOIs
Publication statusPublished - 1 Sept 2017

Keywords

  • Microscopic imaging
  • Near-field scattering
  • Spatial spectra

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Liu, G. Y., Gao, K., Liu, X. F., & Ni, G. Q. (2017). Analysis on Near Field Spatial Spectra Scattering Modeling of Metallic Nanoparticle and Microscopic Imaging. Guang Pu Xue Yu Guang Pu Fen Xi/Spectroscopy and Spectral Analysis, 37(9), 2662-2666. https://doi.org/10.3964/j.issn.1000-0593(2017)09-2662-05