Analysis on near field scattering spectra around nanoparticles by using parametric indirect microscopic imaging

Liu Guoyan; Gao Kun; Liu Xuefeng; Ni Guoqiang

doi:10.1016/j.optcom.2016.05.031

Analysis on near field scattering spectra around nanoparticles by using parametric indirect microscopic imaging

Liu Guoyan^*, Gao Kun, Liu Xuefeng, Ni Guoqiang

^*Corresponding author for this work

School of Optics and Photonics

Research output: Contribution to journal › Article › peer-review

3 Citations (Scopus)

Abstract

We report the simulation and measurement results of near field spatial scattering spectra around nanoparticles. Our measurement and simulations results have indicated that Parametric Indirect Microscopic Imaging can image the near field spatial scattering to a much larger distance from the scattering source of the particle under measurement whereas this part of spatial scattering was lost in the conventional microscopy. Both FDTD modeling and measurement provided evidence that parameters of indirect optical wave vector have higher sensitivity to near field scattering.

Original language	English
Pages (from-to)	59-64
Number of pages	6
Journal	Optics Communications
Volume	377
DOIs	https://doi.org/10.1016/j.optcom.2016.05.031
Publication status	Published - 15 Oct 2016

Keywords

FDTD modeling
Polarization parameters
Scattering spectra

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10.1016/j.optcom.2016.05.031

Cite this

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title = "Analysis on near field scattering spectra around nanoparticles by using parametric indirect microscopic imaging",

abstract = "We report the simulation and measurement results of near field spatial scattering spectra around nanoparticles. Our measurement and simulations results have indicated that Parametric Indirect Microscopic Imaging can image the near field spatial scattering to a much larger distance from the scattering source of the particle under measurement whereas this part of spatial scattering was lost in the conventional microscopy. Both FDTD modeling and measurement provided evidence that parameters of indirect optical wave vector have higher sensitivity to near field scattering.",

keywords = "FDTD modeling, Polarization parameters, Scattering spectra",

author = "Liu Guoyan and Gao Kun and Liu Xuefeng and Ni Guoqiang",

note = "Publisher Copyright: {\textcopyright} 2016 Elsevier B.V.",

year = "2016",

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doi = "10.1016/j.optcom.2016.05.031",

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AU - Guoyan, Liu

AU - Kun, Gao

AU - Xuefeng, Liu

AU - Guoqiang, Ni

PY - 2016/10/15

Y1 - 2016/10/15

N2 - We report the simulation and measurement results of near field spatial scattering spectra around nanoparticles. Our measurement and simulations results have indicated that Parametric Indirect Microscopic Imaging can image the near field spatial scattering to a much larger distance from the scattering source of the particle under measurement whereas this part of spatial scattering was lost in the conventional microscopy. Both FDTD modeling and measurement provided evidence that parameters of indirect optical wave vector have higher sensitivity to near field scattering.

AB - We report the simulation and measurement results of near field spatial scattering spectra around nanoparticles. Our measurement and simulations results have indicated that Parametric Indirect Microscopic Imaging can image the near field spatial scattering to a much larger distance from the scattering source of the particle under measurement whereas this part of spatial scattering was lost in the conventional microscopy. Both FDTD modeling and measurement provided evidence that parameters of indirect optical wave vector have higher sensitivity to near field scattering.

KW - FDTD modeling

KW - Polarization parameters

KW - Scattering spectra

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DO - 10.1016/j.optcom.2016.05.031

M3 - Article

AN - SCOPUS:84969261019

SN - 0030-4018

VL - 377

SP - 59

EP - 64

JO - Optics Communications

JF - Optics Communications

ER -

Analysis on near field scattering spectra around nanoparticles by using parametric indirect microscopic imaging

Abstract

Keywords

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