Analysis and inversion of contact stress for the finite thickness neo-hookean layer

Heng Yang, Xue Feng Yao*, Shen Wang, Yu Chao Ke, Sheng Hao Huang, Ying Hua Liu

*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

33 Citations (Scopus)

Fingerprint

Dive into the research topics of 'Analysis and inversion of contact stress for the finite thickness neo-hookean layer'. Together they form a unique fingerprint.

Engineering

Material Science