Abstract
An overview of scattering centers on conducting objects is presented in this paper. Scattering mechanisms of conducting objects, physical information of scattering centers, as well as the corresponding parametric models are investigated in detail, based on which, the methods of scattering center diagnosing based on ray theory and equivalent currents are further discussed.
Original language | English |
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Title of host publication | 2018 IEEE International Conference on Computational Electromagnetics, ICCEM 2018 |
Publisher | Institute of Electrical and Electronics Engineers Inc. |
ISBN (Electronic) | 9781538612415 |
DOIs | |
Publication status | Published - 17 Oct 2018 |
Event | 2018 IEEE International Conference on Computational Electromagnetics, ICCEM 2018 - Chengdu, China Duration: 26 Mar 2018 → 28 Mar 2018 |
Publication series
Name | 2018 IEEE International Conference on Computational Electromagnetics, ICCEM 2018 |
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Conference
Conference | 2018 IEEE International Conference on Computational Electromagnetics, ICCEM 2018 |
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Country/Territory | China |
City | Chengdu |
Period | 26/03/18 → 28/03/18 |
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Wu, J., Guo, K. Y., & Sheng, X. Q. (2018). An Overview of Scattering Centers on Conducting Objects. In 2018 IEEE International Conference on Computational Electromagnetics, ICCEM 2018 Article 8496581 (2018 IEEE International Conference on Computational Electromagnetics, ICCEM 2018). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/COMPEM.2018.8496581