An auto-test system based on VEE for the improvemet of target positionprecision

Ming Wei, Ning Chen, Ju Zhou, Jingchao Du

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

The influence of amplitude and phase errors on precision of target position is analyzed. To reduce amplitude and phase errors, iterative algorithm is applied in calibration. In this algorithm, amplitude and phase characteristics of all microwave components need to be tested. In this paper, an auto-test system developed in VEE and based on GPIB serial bus technology is introduced. Compared with the traditional manual testing method, the anto-test system improves efficiency and accuracy on the test of digital attenuator and phase shifter with high resolution.

Original languageEnglish
Title of host publicationAdvances in Mechanics Engineering
Pages953-956
Number of pages4
DOIs
Publication statusPublished - 2012
Event2012 International Conference on Advances in Mechanics Engineering, ICAME 2012 - , Hong Kong
Duration: 3 Aug 20125 Aug 2012

Publication series

NameAdvanced Materials Research
Volume588-589
ISSN (Print)1022-6680

Conference

Conference2012 International Conference on Advances in Mechanics Engineering, ICAME 2012
Country/TerritoryHong Kong
Period3/08/125/08/12

Keywords

  • Agilent VEE
  • Automatic test
  • Calibration
  • Target simulator

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