AB method in optical coatings

Hua Qing Wang*, Wei Qiang Lu, Wei Xue, Zhi Nong Yu

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

1 Citation (Scopus)

Abstract

During the manufacture of optical coatings, to control the thickness of every layer is very important. Different monitoring methods may make different accuracy. AB method is much advanced in monitoring the thickness. Through the switch of monitoring glass and appropriate choice of wave length, stop point of each layer was located in sensitive position. With AB method, errors was cut in some degree and the influence of refractive index from many factors was lessened by revising stop points.

Original languageEnglish
Pages (from-to)413-415+418
JournalGuangxue Jishu/Optical Technique
Volume31
Issue numberSUPPL.
Publication statusPublished - Sept 2005

Keywords

  • AB method
  • Linear correction of trigger point
  • Optical coatings

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Wang, H. Q., Lu, W. Q., Xue, W., & Yu, Z. N. (2005). AB method in optical coatings. Guangxue Jishu/Optical Technique, 31(SUPPL.), 413-415+418.