A 90-120 GHz driver amplifier with 70nm InP PHEMT

Jun Liu, Weihua Yu, Xin Lv

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

This paper presents the design and simulation of a three-stage driver amplifier with a 70-nm InAlAs/InGaAs/InP pseudomorphic high electron-mobility transistor (PHEMT) technology. The three-stage driver amplifier is designed through schematic simulation and momentum EM co-simulation by ADS software with a 2×25 μm gate length PHEMT. The high-low pass filter structures are used for matching network, edge-coupled lines are selected to block dc voltage, radial stubs are chosen as RF ground and shunt RC networks are included in the bias circuitry to maintain amplifier stability. Ground coplanar waveguide (GCPW) structure is added in input and output port. The three-stage driver amplifier provides more than 18dB linear gain between 90 and 120GHz, a P-1dB at the output of 7dBm, more than 10dBm saturated output power at 110GHz, consumes 58.9mW and the size is about 2.3×1.1 mm2.

Original languageEnglish
Title of host publication2017 IEEE 6th Asia-Pacific Conference on Antennas and Propagation, APCAP 2017 - Proceeding
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages1-3
Number of pages3
ISBN (Electronic)9781538616086
DOIs
Publication statusPublished - 25 Jul 2018
Event6th IEEE Asia-Pacific Conference on Antennas and Propagation, APCAP 2017 - Xi'an, China
Duration: 16 Oct 201719 Oct 2017

Publication series

Name2017 IEEE 6th Asia-Pacific Conference on Antennas and Propagation, APCAP 2017 - Proceeding

Conference

Conference6th IEEE Asia-Pacific Conference on Antennas and Propagation, APCAP 2017
Country/TerritoryChina
CityXi'an
Period16/10/1719/10/17

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Liu, J., Yu, W., & Lv, X. (2018). A 90-120 GHz driver amplifier with 70nm InP PHEMT. In 2017 IEEE 6th Asia-Pacific Conference on Antennas and Propagation, APCAP 2017 - Proceeding (pp. 1-3). Article 8420777 (2017 IEEE 6th Asia-Pacific Conference on Antennas and Propagation, APCAP 2017 - Proceeding). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/APCAP.2017.8420777