Calculated based on number of publications stored in Pure and citations from Scopus
19992024

Research activity per year

Network

Changming Zhao

  • Beijing Institute of Technology
  • Ministry of Education in China
  • Ministry of Industry and Information Technology
  • University of Science and Technology Beijing
  • Beijing University of Technology

External person

Zhuo Li

  • Beijing Key Lab. for Precision Optoelectronic Measurement Instrument and Technology
  • Beijing Institute of Technology
  • Technical University of Braunschweig
  • Beijing Key Lab. for Precision Optoelectronic Measurement Instrument and Technology
  • Beijing Key Laboratory for Precision Optoelectronic Measurement Instrument and Technology

External person

Yingqi Liao

  • Beijing Key Lab. for Precision Optoelectronic Measurement Instrument and Technology
  • Beijing Institute of Technology
  • China Electronics Technology Group Corporation

External person

Kun Li

  • Beijing Institute of Technology
  • Kunming Institute of Physics
  • Beijing Key Lab. for Precision Optoelectronic Measurement Instrument and Technology
  • China Aerospace Science and Industry Corporation

External person

Yan Hao

  • Beijing Institute of Technology
  • Beijing Key Lab. for Precision Optoelectronic Measurement Instrument and Technology

External person

Xuetong Lin

  • Beijing Key Lab. for Precision Optoelectronic Measurement Instrument and Technology
  • Beijing Institute of Technology

External person

Jing Li

  • Beijing Institute of Technology
  • Beijing Research Institute of Telemetry

External person

Li Jun Cheng

  • Beijing Institute of Technology

External person

Tao He

  • Beijing Institute of Technology

External person

Defang Li

  • Beijing Institute of Technology
  • Beijing Key Lab. for Precision Optoelectronic Measurement Instrument and Technology
  • Technical University of Braunschweig

External person

Guang Hui Wei

  • Beijing Institute of Technology

External person

Peng Xu

  • Beijing Institute of Technology

External person

Xinyu Liu

  • Beijing University of Posts and Telecommunications
  • Beijing Institute of Technology
  • Beijing Key Lab. for Precision Optoelectronic Measurement Instrument and Technology
  • Beijing Key Laboratory for Precision Optoelectronic Measurement Instrument and Technology

External person

Kaizi Hao

  • Beijing Institute of Technology
  • Beijing Key Lab. for Precision Optoelectronic Measurement Instrument and Technology
  • Beijing Simulation Center

External person

Ke Ying Wu

  • Beijing Institute of Technology
  • Tsinghua University

External person

Zhe Guan

  • Beijing Institute of Technology

External person

Hongzhi Yang

  • Beijing Institute of Technology
  • Qian Xuesen Laboratory of Space Technology
  • Fonctions Optiques pour les Technologies de l'Information
  • Qian Xuesen Laboratory of Space Technology
  • Qian Xuesen Laboratory of Space Technology

External person

Lang Zhou

  • Beijing Institute of Technology
  • Beijing Key Lab. for Precision Optoelectronic Measurement Instrument and Technology
  • Shandong Inspur Artificial Intelligence Research Institute Company Limited

External person

Yichen Zhang

  • Beijing Institute of Technology

External person

Zhen Xu

  • Beijing Institute of Technology
  • Beijing Key Lab. for Precision Optoelectronic Measurement Instrument and Technology
  • Beijing Key Laboratory for Precision Optoelectronic Measurement Instrument and Technology

External person

Bi Da Su

  • Beijing Institute of Technology
  • Science and Technology on Optical Radiation Laboratory
  • National Optical Radiation and Scattering Lab
  • Science and Technology on Electro-optic Control Laboratory

External person

Hua Xin Wang

  • Beijing Institute of Technology

External person

Wen Feng Sun

  • University of Science and Technology Beijing
  • Beijing Institute of Technology

External person

Jing Feng Wang

  • Beijing Institute of Technology
  • Changchun University of Science and Technology
  • National Optical Radiation and Scattering Lab

External person

Lei Li

  • University of Science and Technology Beijing
  • Beijing Institute of Technology

External person

Ying Kang

  • Beijing Institute of Technology

External person

Bin Zhao

  • Beijing Institute of Technology
  • Southwest Institute of Technical Physics

External person

Qingfeng Shi

  • Beijing Institute of Technology
  • Beijing Key Lab. for Precision Optoelectronic Measurement Instrument and Technology
  • Beijing Key Laboratory for Precision Optoelectronic Measurement Instrument and Technology

External person

Zheng Zheng

  • Beijing Institute of Technology
  • Beihang University
  • Wuhan University

External person

Jia Yin Hao

  • Beijing Institute of Technology

External person

Wen Xie

  • Beijing Institute of Technology

External person

J. Y. Ke

  • Beijing Institute of Technology

External person

Muhammad Siddique

  • Beijing Institute of Technology

External person

Zhao Changming

  • Beijing Institute of Technology

External person

Bing Jie Sun

  • Beijing Institute of Technology

External person

J. Li

  • Beijing Institute of Technology
  • Fraunhofer Institute for Laser Technology

External person

A. Meissner

  • Fraunhofer Institute for Laser Technology

External person

Chang Xu

  • Beijing Institute of Technology
  • Beijing Key Lab. for Precision Optoelectronic Measurement Instrument and Technology

External person

Yanlei Zuo

  • Science and Technology on Plasma Physics Laboratory
  • China Academy of Engineering Physics

External person

Chun Xiang Yang

  • Beijing Institute of Technology

External person

Chen Ling

  • Beijing Institute of Technology
  • Academy of Military Medical Science China

External person

D. Hoffmann

  • Fraunhofer Institute for Laser Technology
  • Technische Universität Darmstadt

External person

Xin Peng Sun

  • Beijing Institute of Technology

External person

Yiting Wang

  • Beijing Institute of Technology
  • Beijing Key Lab. for Precision Optoelectronic Measurement Instrument and Technology

External person

Junwen Ji

  • Beijing Institute of Technology
  • Beijing Key Lab. for Precision Optoelectronic Measurement Instrument and Technology

External person

Li Gang Yuan

  • North China Research Institute of Electro-Optics

External person

Zhaoli Li

  • Science and Technology on Plasma Physics Laboratory
  • China Academy of Engineering Physics
  • Beijing Institute of Technology

External person

Rui Wang

  • Beijing Institute of Technology
  • Beijing Key Lab. for Precision Optoelectronic Measurement Instrument and Technology
  • CAS - Institute of Semiconductors

External person

Yu Wang

  • Beijing Institute of Technology
  • College of Computing and Informatics
  • Temple University
  • Chinese Academy of Fishery Sciences
  • Department of Computer and Information Sciences
  • Taiyuan University of Technology
  • Guangzhou University
  • University of North Carolina at Charlotte
  • School of Computer Science

External person

Marc Brunel

  • Fonctions Optiques pour les Technologies de l'Information
  • Institut de Physique de Rennes

External person

Xinpeng Sun

  • Beijing Institute of Technology

External person

Shitao Wang

  • China Aerospace Science and Technology Corporation

External person

Yanlei Qian

  • Beijing Institute of Technology

External person

Can Zhao Wang

  • Beijing Institute of Technology

External person

Nuan Rang Wang

  • Beijing Institute of Technology
  • China Aerospace Science and Industry Corporation

External person

Chao Yang Fan

  • Beijing Institute of Technology
  • Beijing Key Laboratory for Precision Optoelectronic Measurement Instrument and Technology

External person

Qi Jun Jiang

  • Beijing Institute of Technology

External person

Chao Feng Li

  • China Electronics Technology Group Corporation
  • Beijing Institute of Technology
  • Beijing Key Laboratory for Precision Optoelectronic Measurement Instrument and Technology

External person

Fengbin Gao

  • Beijing Institute of Technology

External person

Shizhe Ma

  • Zhejiang University

External person

Xinye Wang

  • Beijing Institute of Technology

External person

Yudi Zhou

  • Zhejiang University

External person

Meng Zhang

  • Beijing Institute of Technology
  • Ministry of Education in China
  • Ministry of Industry and Information Technology
  • Beijing Key Lab. for Precision Optoelectronic Measurement Instrument and Technology

External person

Dong Liu

  • Jiaxing Key Laboratory of Photonic Sensing & Intelligent Imaging
  • Zhejiang University

External person

Wei Zhang

  • Beijing Institute of Technology

External person

Chong Liu

  • Zhejiang University

External person

Zhang Dehua

  • Beijing Institute of Technology

External person

Qun Liu

  • Zhejiang University

External person

Lulu Yang

  • Beijing Institute of Technology
  • Beijing Key Lab. for Precision Optoelectronic Measurement Instrument and Technology

External person

Hao Hua

  • Science and Technology on Optical Radiation Laboratory

External person

Hongkai Zhao

  • Zhejiang University

External person

Yinglei Liang

  • Beijing Institute of Technology

External person

Yang Hongzhi

  • Beijing Institute of Technology

External person

Junna Guan

  • Beijing Institute of Technology

External person

Xue Song Ma

  • Beijing Institute of Technology

External person

Dehua Zhang

  • Beijing Institute of Technology

External person

Jian Du

  • Beijing Simulation Center

External person

Jianwei He

  • Beijing Institute of Technology

External person

Jian Song

  • Beijing Research Institute of Telemetry

External person

Guan Zhe

  • Beijing Institute of Technology

External person

Ruoyi Qi

  • Beijing Institute of Technology
  • Beijing Key Lab. for Precision Optoelectronic Measurement Instrument and Technology

External person

Jingqin Su

  • Science and Technology on Plasma Physics Laboratory
  • China Academy of Engineering Physics

External person

Qian Zhao

  • Beijing Institute of Technology
  • Beijing Key Lab. for Precision Optoelectronic Measurement Instrument and Technology

External person

Qihai Zhu

  • Beijing Institute of Technology

External person

Quanxin Na

  • Beijing Institute of Technology
  • Ministry of Industry and Information Technology

External person

Peituo Xu

  • Zhejiang University

External person

Yongming Zhao

  • Beijing Institute of Technology
  • Beijing Key Lab. for Precision Optoelectronic Measurement Instrument and Technology

External person

Rui Shi

  • Ministry of Education in China
  • Beijing Institute of Technology
  • Beijing Key Lab. for Precision Optoelectronic Measurement Instrument and Technology
  • Beijing Key Lab. for Precision Optoelectronic Measurement Instrument and Technology
  • Beijing Key Laboratory for Precision Optoelectronic Measurement Instrument and Technology
  • Lanshi Optics Technology (Beijing) Co., Ltd
  • Lanshi Optics Technology (Beijing) Co. Ltd.

External person

Jian Zhang

  • Jiangsu Normal University
  • Nanyang Technological University
  • CAS - Shanghai Institute of Ceramics

External person

Xia Wu

  • Beijing Institute of Technology

External person

Lan Wu

  • Zhejiang University

External person

M. Hoefer

  • Fraunhofer Institute for Laser Technology

External person

Chen Li

  • Beijing Institute of Technology
  • Ministry of Industry and Information Technology
  • Shaanxi University of Science and Technology

External person

Qiuling Gu

  • Zhejiang University

External person

Yixuan Zhang

  • Beijing Institute of Technology
  • Ministry of Industry and Information Technology

External person

Jian Wei He

  • Beijing Institute of Technology

External person

Wenbo Sun

  • Donghai Laboratory
  • Donghai Laboratory

External person

Hong Yan

  • Beijing Institute of Technology
  • Beijing Key Lab. for Precision Optoelectronic Measurement Instrument and Technology

External person

Bingnan Wang

  • Beijing Institute of Technology
  • Beijing Key Lab. for Precision Optoelectronic Measurement Instrument and Technology

External person

Yiming Zhao

  • Beijing Research Institute of Telemetry
  • Beijing Institute of Technology

External person

Bao Li

  • The Eleventh Research Institute of China Electronic Science and Technology Group Corporation

External person

Zhu Guan

  • Beijing Institute of Technology

External person

Peng Zhang

  • Beijing Institute of Technology

External person

Dong Sheng Jiang

  • North China Research Institute of Electro-Optics

External person

He Wang

  • Beijing Institute of Technology
  • National Institute of Metrology China

External person

Jiushuai Xu

  • Technical University of Braunschweig

External person

Jingqin Su

  • Science and Technology on Plasma Physics Laboratory

External person

Zhongbo Geng

  • Beijing Institute of Technology

External person

Shuhua Wang

  • Science and Technology on Optical Radiation Laboratory

External person

Hua Yong Zhang

  • Anhui University

External person

Na Liu

  • Beijing Institute of Technology

External person

Tiit Kutser

  • University of Tartu

External person

Yunshi Wang

  • Beijing Institute of Technology

External person

Dongbing He

  • Beijing Institute of Technology

External person

Gao Jin-Yue

  • Jilin University
  • China Center of Advanced Science and Technology World Laboratory

External person

M. Hofer

  • Fraunhofer Institute for Laser Technology

External person

Biao He

  • Beijing Institute of Technology

External person

Tao Hu

  • Science and Technology on Electro-Optical Information Security Control Laboratory

External person

Xichen Yuan

  • Beijing Institute of Technology
  • Beijing Key Lab. for Precision Optoelectronic Measurement Instrument and Technology

External person

Huijie Shan

  • Beijing Institute of Technology

External person

Sun Xinpeng

  • Beijing Institute of Technology

External person

Li Lei

  • Beijing Institute of Technology

External person

Hongda Wu

  • Zhejiang University

External person

Haiyan Sheng

  • Institute of Environmental Protection Science

External person

He Tao

  • Beijing Institute of Technology

External person

Xu Peng

  • Beijing Institute of Technology

External person

Hans Joachim Eichler

  • Technical University of Berlin
  • Institute of Optics and Atomic Physics
  • Zhejiang University

External person

Wang Yu

  • Beijing Institute of Technology

External person

Yan Zhao

  • Beijing Institute of Technology

External person

Lianjie Qin

  • Shandong University

External person

P. Kucirek

  • Fraunhofer Institute for Laser Technology

External person

Yanlei Zuo

  • Science and Technology on Plasma Physics Laboratory

External person

Weijiang Xu

  • Université Polytechnique Hauts-de-France
  • INSA Hauts-de-France
  • Université Polytechnique Hauts-de-France

External person

Xiangyi Chen

  • Beijing Institute of Technology

External person

Adelbert Ding

  • Technical University of Berlin

External person

Bosong Wang

  • Beijing Information Science & Technology University
  • National Institute of Metrology China

External person

D. X. Hu

  • Beijing Institute of Technology

External person

Zhang Yichen

  • Beijing Institute of Technology

External person

Wang Dong

  • Jilin University

External person

Huade Zhao

  • State Environmental Protection Key Laboratory of Coastal Ecosystem

External person

Tianze Zhao

  • Beijing Institute of Technology
  • Beijing Key Lab. for Precision Optoelectronic Measurement Instrument and Technology

External person

Chenlin Du

  • Shandong University

External person

Yang Chen

  • Zhejiang University

External person

Marc Vallet

  • Fonctions Optiques pour les Technologies de l'Information
  • Institut de Physique de Rennes

External person

Sheng Wang

  • Beijing Institute of Technology

External person

Miguel Ángel Muñoz

  • Technical University of Madrid

External person

Yue Peng

  • Science and Technology on Electro-optic Control Laboratory

External person

Jia Ze Li

  • Beijing Institute of Technology

External person

Zheng Xingyuan

  • Beijing Institute of Technology

External person

Ute Seelig

  • Technical University of Berlin

External person

Lan Gao

  • Beijing Institute of Technology

External person

Xianmei Wu

  • CAS - Institute of Acoustics
  • University of Chinese Academy of Sciences
  • CAS - Institute of Semiconductors
  • Beijing Institute of Technology
  • Chinese Academy of Sciences

External person

Kang Zhao

  • National Optical Radiation and Scattering Lab
  • Beijing Institute of Technology

External person

Chengchong Jiang

  • Zhejiang University

External person

Jingxin Su

  • China Academy of Engineering Physics
  • Science and Technology on Plasma Physics Laboratory

External person

Xianlin Meng

  • Shandong University

External person

Xiaoyu Cui

  • Zhejiang University

External person

Ying Zhang

  • Beijing Institute of Technology
  • Beijing Key Lab. for Precision Optoelectronic Measurement Instrument and Technology

External person

Daolun Han

  • Macro-Micro Electronics Technology Co. Ltd.

External person

Yu Zhe Liu

  • Beijing Research Institute of Telemetry

External person

Hao Cui

  • Beijing Institute of Technology

External person

Xingyuan Zheng

  • Beijing Institute of Technology

External person

Ming Jun Wang

  • Xi'an University of Technology

External person

Lingyun Wu

  • Zhejiang University

External person

Han Zhang

  • Zhejiang University

External person

Xiangli Bi

  • Science and Technology on Electro-Optical Information Security Control Laboratory
  • Beijing Institute of Technology

External person

Donglai Li

  • Beijing Institute of Technology
  • Huaneng Clean Energy Research Institute

External person

Miao Hu

  • Hangzhou Dianzi University

External person

Keyi Wang

  • Macro-Micro Electronics Technology Co. Ltd.

External person

Cheng Liu

  • Beijing Institute of Technology

External person

Gao Lan

  • Beijing Institute of Technology

External person

Junhai Liu

  • Technical University of Berlin

External person

Yijie Pan

  • National Institute of Metrology China

External person

Meichen Long

  • Beijing Institute of Technology

External person

Yanjin Li

  • Beijing Institute of Technology

External person

Lei Li

  • CAS - Shanghai Institute of Optics and Fine Mechanics

External person

Ronghua Ma

  • CAS - Nanjing Institute of Geography and Limnology

External person

Siddique Muhammad

  • Beijing Institute of Technology

External person

Erwin Peiner

  • Technical University of Braunschweig

External person

Liu Jiawei

  • China Ordnance Equipment Research Academy

External person

Hua Zhong

  • Science and Technology on Optical Radiation Laboratory

External person

Chenyu Guo

  • Beijing Institute of Technology

External person

Tao Liping

  • Beijing Institute of Technology

External person

Xinguang Xu

  • Shandong University

External person

Jian Bai

  • Zhejiang University

External person

Zongshu Shao

  • Shandong University

External person

Li Zhu

  • Shandong University

External person

Zhaoli Li

  • Science and Technology on Plasma Physics Laboratory

External person

Jürgen Erhard

  • Technical University of Berlin

External person

Yicai Han

  • Institute of Environmental Protection Science

External person

Yatong Chen

  • Zhejiang University

External person

Zhaoli Li

  • Beijing Institute of Technology

External person

Jiaojiao Wang

  • Beijing Institute of Technology
  • Beijing Key Lab. for Precision Optoelectronic Measurement Instrument and Technology

External person

Jingyi Chen

  • Beijing Institute of Technology
  • CAS - Institute of Semiconductors

External person

Guang Shi

  • Beijing Institute of Technology

External person

Rong Deng

  • Science and Technology on Optical Radiation Laboratory

External person

Sichen Zhang

  • Beijing Institute of Technology
  • Beijing Key Lab. for Precision Optoelectronic Measurement Instrument and Technology

External person

Ming Shuo Fu

  • University of Science and Technology Beijing

External person

Ying Chen

  • Beijing Institute of Technology

External person

Bernd Ozygus

  • Technical University of Berlin

External person

Chun Liu

  • Beijing Institute of Technology

External person

Jie Liu

  • Beijing Institute of Technology

External person

Zhaozhao Yao

  • Beijing Institute of Technology

External person

Yanyan Li

  • Beijing Institute of Technology
  • Beijing Key Lab. for Precision Optoelectronic Measurement Instrument and Technology

External person

Xinyuan Zheng

  • Beijing Institute of Technology

External person

I. Lopez-Perez

  • Fraunhofer Institute for Laser Technology

External person

Wang Huaxin

  • Beijing Institute of Technology

External person

Hao Peng

  • China Academy of Engineering Physics
  • Science and Technology on Plasma Physics Laboratory

External person

Ziwei Yao

  • State Environmental Protection Key Laboratory of Coastal Ecosystem

External person

Zhijie Liu

  • Beijing Institute of Technology

External person

Jingfeng Wang

  • Science and Technology on Optical Radiation Laboratory

External person

Pingping Luo

  • Beijing Institute of Technology

External person

Zhifeng Lin

  • Beijing Institute of Technology
  • Technical University of Berlin

External person

Yi Lei Cao

  • Beijing Institute of Technology

External person

Henrich Frielinghaus

  • Jülich Research Centre

External person

Miao Hu

  • Hangzhou Dianzi University

External person

Yiheng Song

  • Science and Technology on Electro-Optical Information Security Control Laboratory

External person

Dong Mei Hong

  • North Res. Inst. of Electro-Optics

External person

Shihao Li

  • Beijing Institute of Technology

External person

Li Ping Tao

  • Beijing Institute of Technology

External person

Horst Weber

  • Technical University of Berlin
  • Beijing Institute of Technology
  • Laser- und Medizin-Technologie Ggmbh

External person