摘要
Cross-project defect prediction is a hot topic in the field of defect prediction. How to reduce the difference between projects and make the model have better accuracy is the core problem. This paper starts from two perspectives: feature selection and distance-weight instance transfer. We reduce the differences between projects from the perspective of feature engineering and introduce the transfer learning technology to construct a cross-project defect prediction model WCM-WTrA and multi-source model Multi-WCM-WTrA. We have tested on AEEEM and ReLink datasets, and the results show that our method has an average improvement of 23% compared with TCA+ algorithm on AEEEM datasets, and an average improvement of 5% on ReLink datasets.
源语言 | 英语 |
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页(从-至) | 354-366 |
页数 | 13 |
期刊 | Chinese Journal of Electronics |
卷 | 31 |
期 | 2 |
DOI | |
出版状态 | 已出版 - 3月 2022 |