Wavefront fitting and evaluation of fiber point diffraction interferometer

Shuo Wu*, Ding Guo Sha, Jia Ming Lin, Tao Geng Zhou, Ling Feng Chen, Liang Nie

*此作品的通讯作者

科研成果: 书/报告/会议事项章节会议稿件同行评审

摘要

This paper presents Zernike polynomials fitting wave front which is detected by fiber point diffraction interferometer (FPDI). To confirm that Zernike polynomials are suitable for fitting concave spherical mirror surface, different orders of Zernike polynomials were used to fit several different surfaces which are produced by computer. Fitting result errors were evaluated by residual standard deviation. It is illuminated that Zernike polynomials are suitable for fitting surface which changes smoothly but not suitable for fitting surface with sharp fluctuating. When the shape changes dramatically Zernike polynomials are unable to correctly fit. Choosing appropriate term of polynomials, more terms don't mean higher precision. A metal coated concave spherical mirror, curvature radius 580mm, caliber 70mm, was measured as a sample. The five-step phase shifting interferograms of good quality were detected by an experimental FPDI which was built in lab. Measured wave front was fitted by 36 terms of Zernike polynomials from phase map which were unwrapped from five-step phase shifting interferograms. The measurement result was obtained and compared with that by Zygo interferometer when measured the same mirror. The 2 represented wave fronts have same characters such as centers bulging and marginal trough.

源语言英语
主期刊名3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies
主期刊副标题Optical Test and Measurement Technology and Equipment
DOI
出版状态已出版 - 2007
活动3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment - Chengdu, 中国
期限: 8 7月 200712 7月 2007

出版系列

姓名Proceedings of SPIE - The International Society for Optical Engineering
6723
ISSN(印刷版)0277-786X

会议

会议3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
国家/地区中国
Chengdu
时期8/07/0712/07/07

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