Virtual-real combination Ritchey-Common interferometry

Yiming Liu, Yao Hu*, Shaohui Zhang, Shen Huang, Jinpeng Li, Limin Yan, Jiahang Lv, Zhen Wang, Xu Chang, Qun Hao

*此作品的通讯作者

科研成果: 期刊稿件文章同行评审

7 引用 (Scopus)
Plum Print visual indicator of research metrics
  • Citations
    • Citation Indexes: 7
  • Captures
    • Readers: 4
see details

摘要

Large optical flats play a remarkable role in advanced large-aperture optical systems and the testing of the surface shape error is indispensable for the fabrication. The widely adopted Ritchey-Common test for large optical flats will fail without the rigorous test configurations including a large F/# prerequisition and a flat-to-interferometer distance invariance. A virtual-real combination Ritchey-Common interferometry is proposed to avoid the large F/# prerequisition by accurately modelling the optical path in a virtual interferometer. Furthermore, a virtual-real combination iterative algorithm is proposed in this method to break the flat-to-interferometer distance invariance. Measurement experiments for 100 mm and 422 mm aperture flats were performed to demonstrate the feasibility of this method. Compared with a direct testing in a standard Zygo interferometer, the peak to valley (PV) and root mean square (RMS) errors were less than 0.1 λ and 0.01 λ (λ=632.8 nm), respectively, in different Ritchey angles and flat-to-interferometer distances. Further numerical simulations demonstrate that RMS errors for various Zernike aberrations in arbitrary F/# are less than 0.01 λ. This method can break the distance invariance restriction and achieve high accuracy with an arbitrary F/#, thus providing substantial freedom in the design of test configurations to accommodate various test scenarios.

源语言英语
页(从-至)15777-15795
页数19
期刊Optics Express
30
9
DOI
出版状态已出版 - 25 4月 2022

指纹

探究 'Virtual-real combination Ritchey-Common interferometry' 的科研主题。它们共同构成独一无二的指纹。

引用此

Liu, Y., Hu, Y., Zhang, S., Huang, S., Li, J., Yan, L., Lv, J., Wang, Z., Chang, X., & Hao, Q. (2022). Virtual-real combination Ritchey-Common interferometry. Optics Express, 30(9), 15777-15795. https://doi.org/10.1364/OE.457704