Transmission electron microscopy and its applications in secondary batteries

Lixia Bao, Ruiwen Shao, Tinglu Song, Yong Yang, Fan Xu*

*此作品的通讯作者

科研成果: 书/报告/会议事项章节章节同行评审

摘要

Transmission electron microscopy (TEM) has been widely employed as an important technique for detecting morphology in various secondary battery applications. When integrated with diverse accessories, TEM could attain sub-angstrom level detection, cryogenic TEM (cryo-TEM), and other functionalities, which enables the observation and comprehension of the microstructure of secondary battery materials, as well as structural variations during battery charging and discharging processes. In this chapter, essential structures, main functions, and sample preparation methods of TEM are introduced. Additionally, applications of TEM in characterizing materials used in secondary batteries are discussed and summarized. The aim is to provide essential guidance for employing TEM and to facilitate its future development.

源语言英语
主期刊名Advanced Characterization Technologies for Secondary Batteries
出版商Bentham Science Publishers
1-36
页数36
ISBN(电子版)9789815305425
ISBN(印刷版)9789815305432
DOI
出版状态已出版 - 4 11月 2024

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引用此

Bao, L., Shao, R., Song, T., Yang, Y., & Xu, F. (2024). Transmission electron microscopy and its applications in secondary batteries. 在 Advanced Characterization Technologies for Secondary Batteries (页码 1-36). Bentham Science Publishers. https://doi.org/10.2174/9789815305425124010004