Three-dimensional measurement with stereo polarization digital image correlation method insensitive to ambient light

Xi Xu, Yao Hu*, Shaohui Zhang, Qun Hao

*此作品的通讯作者

科研成果: 书/报告/会议事项章节会议稿件同行评审

摘要

The measurement of the external topography and deformation of large industrial equipment is important. Photoelectric measurement technology can quickly obtain three-dimensional (3D) topography information of components and equipment. Among them, stereo digital image correlation (stereo-DIC) is a 3D measurement method which combines binocular stereo vision system and digital image cross-correlation matching technology. This method has many advantages such as non-contact, wide measuring range, high speed and single frame reconstruction. However, this passive optical measurement method is prone to the interference of ambient light and the impact of high reflective surface, resulting in data loss, which limits the application scenarios of this method. This paper proposes a method of 3D reconstruction against ambient light based on stereo polarization digital image correlation (stereo-PDIC). In this method, speckle is generated by a laser beam irradiating a ground glass and is then projected onto the surface of the target. The polarization speckle image in single frame and multiple polarization channels is collected by binocular polarizing cameras. The influence of the reflected stray light and ambient light is eliminated and the contrast of speckle image is improved. Stereo matching of the speckle images with the corresponding angle of polarization captured by the binocular polarizing cameras is carried out, and finally the 3D reconstruction of the target is completed. The feasibility of this method is verified by both simulation and experiment.

源语言英语
主期刊名2021 International Conference on Optical Instruments and Technology
主期刊副标题Optoelectronic Measurement Technology and Systems
编辑Jigui Zhu, Lijiang Zeng, Jie Jiang, Sen Han
出版商SPIE
ISBN(电子版)9781510655690
DOI
出版状态已出版 - 2022
活动2021 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems - Virtual, Online, 中国
期限: 8 4月 202210 4月 2022

出版系列

姓名Proceedings of SPIE - The International Society for Optical Engineering
12282
ISSN(印刷版)0277-786X
ISSN(电子版)1996-756X

会议

会议2021 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems
国家/地区中国
Virtual, Online
时期8/04/2210/04/22

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