TY - JOUR
T1 - Thermal crosstalk simulation and measurement of linear terahertz detector arrays
AU - Li, Weizhi
AU - Huang, Zehua
AU - Wang, Jun
AU - Li, Mingyu
AU - Gou, Jun
AU - Jiang, Yadong
N1 - Publisher Copyright:
© 2015 Elsevier B.V. All rights reserved.
PY - 2015/11/1
Y1 - 2015/11/1
N2 - Thermal simulation of differently structured linear terahertz detector arrays (TDAs) based on lithium tantalate was performed by finite element analysis (FEA). Simulation results revealed that a relatively simple TDA structure can have good thermal insulation, i.e., low thermal crosstalk effect (TCE), between adjacent pixels, which was thus selected for the real fabrication of TDA sample. Current responsivity (Ri) of the sample for a 2.52 THz source was measured to be 6.66 × 10-6 A/W and non-uniformity (NU) of Ri was 4.1%, showing good performance of the sample. TCE test result demonstrated that small TCE existed in the sample, which was in good agreement with the simulation results.
AB - Thermal simulation of differently structured linear terahertz detector arrays (TDAs) based on lithium tantalate was performed by finite element analysis (FEA). Simulation results revealed that a relatively simple TDA structure can have good thermal insulation, i.e., low thermal crosstalk effect (TCE), between adjacent pixels, which was thus selected for the real fabrication of TDA sample. Current responsivity (Ri) of the sample for a 2.52 THz source was measured to be 6.66 × 10-6 A/W and non-uniformity (NU) of Ri was 4.1%, showing good performance of the sample. TCE test result demonstrated that small TCE existed in the sample, which was in good agreement with the simulation results.
KW - Current responsivity
KW - Finite element analysis
KW - Terahertz detector
KW - Thermal crosstalk effect
UR - http://www.scopus.com/inward/record.url?scp=84942118250&partnerID=8YFLogxK
U2 - 10.1016/j.infrared.2015.09.002
DO - 10.1016/j.infrared.2015.09.002
M3 - Article
AN - SCOPUS:84942118250
SN - 1350-4495
VL - 73
SP - 73
EP - 77
JO - Infrared Physics and Technology
JF - Infrared Physics and Technology
ER -