The research of data acquisition system for Raman spectrometer

Xiao Cui*, Pan Guo, Yinchao Zhang, Siying Chen, He Chen, Wenbo Chen

*此作品的通讯作者

科研成果: 书/报告/会议事项章节会议稿件同行评审

摘要

Raman spectrometer has been widely used as an identification tool for analyzing material structure and composition in many fields. However, Raman scattering echo signal is very weak, about dozens of photons at most in one laser plus signal. Therefore, it is a great challenge to design a Raman spectrum data acquisition system which could accurately receive the weak echo signal. The system designed in this paper receives optical signals with the principle of photon counter and could detect single photon. The whole system consists of a photoelectric conversion module H7421-40 and a photo counting card including a field programmable gate array (FPGA) chip and a PCI9054 chip. The module H7421-40 including a PMT, an amplifier and a discriminator has high sensitivity on wavelength from 300nm to 720nm. The Center Wavelength is 580nm which is close to the excitation wavelength (532nm), QE 40% at peak wavelength, Count Sensitivity is 7.8-105(S-1PW-1) and Count Linearity is 1.5MHZ. In FPGA chip, the functions are divided into three parts: parameter setting module, controlling module, data collection and storage module. All the commands, parameters and data are transmitted between FPGA and computer by PCI9054 chip through the PCI interface. The result of experiment shows that the Raman spectrum data acquisition system is reasonable and efficient. There are three primary advantages of the data acquisition system: the first one is the high sensitivity with single photon detection capability; the second one is the high integrated level which means all the operation could be done by the photo counting card; and the last one is the high expansion ability because of the smart reconfigurability of FPGA chip.

源语言英语
主期刊名2011 International Conference on Optical Instruments and Technology
主期刊副标题Optoelectronic Measurement Technology and Systems
出版商SPIE
ISBN(印刷版)9780819488428
DOI
出版状态已出版 - 2011
活动2011 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems - Beijing, 中国
期限: 6 11月 20119 11月 2011

出版系列

姓名Proceedings of SPIE - The International Society for Optical Engineering
8201
ISSN(印刷版)0277-786X

会议

会议2011 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems
国家/地区中国
Beijing
时期6/11/119/11/11

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