The calculation method of reliability based on MEMS Safety and Arming device

Wang Fufu*, Lou Wenzhong, Liu Fangyi, Wang Dakui, Jin Xin, Lu Jun, Wu Jian, Guo Xuhong, Zhang Zhe

*此作品的通讯作者

科研成果: 书/报告/会议事项章节会议稿件同行评审

摘要

In this paper, aiming at the failure mode with MEMS spring fracture of MEMS S&A (Safety and Arming) device, the dynamic simulation and response surface method are combined to use to establish the relationship between the structure response and the structure random variables. The stress values are fitted by the least square method, and the binary quadratic equation, whose variables are the MEMS spring's elastic modulus, the MEMS spring's breaking strength and thickness and the output is the value of determination function, is obtained. Finally, using Monte Carlo method for a large number of random state numerical value, obtained the MEMS spring fracture of MEMS S&A device reliability is 0.9999996.

源语言英语
主期刊名2015 IEEE 10th International Conference on Nano/Micro Engineered and Molecular Systems, NEMS 2015
出版商Institute of Electrical and Electronics Engineers Inc.
426-429
页数4
ISBN(电子版)9781467366953
DOI
出版状态已出版 - 1 7月 2015
活动10th IEEE International Conference on Nano/Micro Engineered and Molecular Systems, NEMS 2015 - Xi'an, 中国
期限: 7 4月 201511 4月 2015

出版系列

姓名2015 IEEE 10th International Conference on Nano/Micro Engineered and Molecular Systems, NEMS 2015

会议

会议10th IEEE International Conference on Nano/Micro Engineered and Molecular Systems, NEMS 2015
国家/地区中国
Xi'an
时期7/04/1511/04/15

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