Study on failure models and degradation rate of PV aged modules in field in China

Hailing Li; Fang Lv

doi:10.1109/PVSC.2018.8547795

Study on failure models and degradation rate of PV aged modules in field in China

Hailing Li, Fang Lv

科研成果: 书/报告/会议事项章节 › 会议稿件 › 同行评审

摘要

This paper presents the analysis of degradation rate and fail models of PV crystalline silicon modules operated 1030 years from 5 plants 4 climatic zones in China. The PV modules wereused as off-grid home system, roof on-grid system, and ground on-grid system. The 4 climatic zones cover most of PV market in China. By visual inspection study we find that the highest frequency of failure model found here is metallization and interconnect corrosion. The average degradation rate of the tested modules is 0.73%/year. No clear correlation between degradation rate and climatic zone is found.

源语言	英语
主期刊名	2018 IEEE 7th World Conference on Photovoltaic Energy Conversion, WCPEC 2018 - A Joint Conference of 45th IEEE PVSC, 28th PVSEC and 34th EU PVSEC
出版商	Institute of Electrical and Electronics Engineers Inc.
页	727-730
页数	4
ISBN（电子版）	9781538685297
DOI	https://doi.org/10.1109/PVSC.2018.8547795
出版状态	已出版 - 26 11月 2018
已对外发布	是
活动	7th IEEE World Conference on Photovoltaic Energy Conversion, WCPEC 2018 - Waikoloa Village, 美国期限: 10 6月 2018 → 15 6月 2018

出版系列

姓名	2018 IEEE 7th World Conference on Photovoltaic Energy Conversion, WCPEC 2018 - A Joint Conference of 45th IEEE PVSC, 28th PVSEC and 34th EU PVSEC

会议

会议	7th IEEE World Conference on Photovoltaic Energy Conversion, WCPEC 2018
国家/地区	美国
市	Waikoloa Village
时期	10/06/18 → 15/06/18

联合国可持续发展目标

此成果有助于实现下列可持续发展目标：

访问文件

10.1109/PVSC.2018.8547795

其它文件与链接

链接到 Scopus 的出版物

引用此

Li, H., & Lv, F. (2018). Study on failure models and degradation rate of PV aged modules in field in China. 在 2018 IEEE 7th World Conference on Photovoltaic Energy Conversion, WCPEC 2018 - A Joint Conference of 45th IEEE PVSC, 28th PVSEC and 34th EU PVSEC (页码 727-730). 文章 8547795 (2018 IEEE 7th World Conference on Photovoltaic Energy Conversion, WCPEC 2018 - A Joint Conference of 45th IEEE PVSC, 28th PVSEC and 34th EU PVSEC). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/PVSC.2018.8547795

Li, Hailing ; Lv, Fang. / Study on failure models and degradation rate of PV aged modules in field in China. 2018 IEEE 7th World Conference on Photovoltaic Energy Conversion, WCPEC 2018 - A Joint Conference of 45th IEEE PVSC, 28th PVSEC and 34th EU PVSEC. Institute of Electrical and Electronics Engineers Inc., 2018. 页码 727-730 (2018 IEEE 7th World Conference on Photovoltaic Energy Conversion, WCPEC 2018 - A Joint Conference of 45th IEEE PVSC, 28th PVSEC and 34th EU PVSEC).

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title = "Study on failure models and degradation rate of PV aged modules in field in China",

abstract = "This paper presents the analysis of degradation rate and fail models of PV crystalline silicon modules operated 1030 years from 5 plants 4 climatic zones in China. The PV modules wereused as off-grid home system, roof on-grid system, and ground on-grid system. The 4 climatic zones cover most of PV market in China. By visual inspection study we find that the highest frequency of failure model found here is metallization and interconnect corrosion. The average degradation rate of the tested modules is 0.73%/year. No clear correlation between degradation rate and climatic zone is found.",

keywords = "Degradation, Power system reliability",

author = "Hailing Li and Fang Lv",

note = "Publisher Copyright: {\textcopyright} 2018 IEEE.; 7th IEEE World Conference on Photovoltaic Energy Conversion, WCPEC 2018 ; Conference date: 10-06-2018 Through 15-06-2018",

year = "2018",

month = nov,

day = "26",

doi = "10.1109/PVSC.2018.8547795",

language = "English",

series = "2018 IEEE 7th World Conference on Photovoltaic Energy Conversion, WCPEC 2018 - A Joint Conference of 45th IEEE PVSC, 28th PVSEC and 34th EU PVSEC",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

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booktitle = "2018 IEEE 7th World Conference on Photovoltaic Energy Conversion, WCPEC 2018 - A Joint Conference of 45th IEEE PVSC, 28th PVSEC and 34th EU PVSEC",

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Li, H & Lv, F 2018, Study on failure models and degradation rate of PV aged modules in field in China. 在 2018 IEEE 7th World Conference on Photovoltaic Energy Conversion, WCPEC 2018 - A Joint Conference of 45th IEEE PVSC, 28th PVSEC and 34th EU PVSEC., 8547795, 2018 IEEE 7th World Conference on Photovoltaic Energy Conversion, WCPEC 2018 - A Joint Conference of 45th IEEE PVSC, 28th PVSEC and 34th EU PVSEC, Institute of Electrical and Electronics Engineers Inc., 页码 727-730, 7th IEEE World Conference on Photovoltaic Energy Conversion, WCPEC 2018, Waikoloa Village, 美国, 10/06/18. https://doi.org/10.1109/PVSC.2018.8547795

Study on failure models and degradation rate of PV aged modules in field in China. / Li, Hailing; Lv, Fang.
2018 IEEE 7th World Conference on Photovoltaic Energy Conversion, WCPEC 2018 - A Joint Conference of 45th IEEE PVSC, 28th PVSEC and 34th EU PVSEC. Institute of Electrical and Electronics Engineers Inc., 2018. 页码 727-730 8547795 (2018 IEEE 7th World Conference on Photovoltaic Energy Conversion, WCPEC 2018 - A Joint Conference of 45th IEEE PVSC, 28th PVSEC and 34th EU PVSEC).

科研成果: 书/报告/会议事项章节 › 会议稿件 › 同行评审

TY - GEN

T1 - Study on failure models and degradation rate of PV aged modules in field in China

AU - Li, Hailing

AU - Lv, Fang

PY - 2018/11/26

Y1 - 2018/11/26

N2 - This paper presents the analysis of degradation rate and fail models of PV crystalline silicon modules operated 1030 years from 5 plants 4 climatic zones in China. The PV modules wereused as off-grid home system, roof on-grid system, and ground on-grid system. The 4 climatic zones cover most of PV market in China. By visual inspection study we find that the highest frequency of failure model found here is metallization and interconnect corrosion. The average degradation rate of the tested modules is 0.73%/year. No clear correlation between degradation rate and climatic zone is found.

AB - This paper presents the analysis of degradation rate and fail models of PV crystalline silicon modules operated 1030 years from 5 plants 4 climatic zones in China. The PV modules wereused as off-grid home system, roof on-grid system, and ground on-grid system. The 4 climatic zones cover most of PV market in China. By visual inspection study we find that the highest frequency of failure model found here is metallization and interconnect corrosion. The average degradation rate of the tested modules is 0.73%/year. No clear correlation between degradation rate and climatic zone is found.

KW - Degradation

KW - Power system reliability

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U2 - 10.1109/PVSC.2018.8547795

DO - 10.1109/PVSC.2018.8547795

M3 - Conference contribution

AN - SCOPUS:85059899068

T3 - 2018 IEEE 7th World Conference on Photovoltaic Energy Conversion, WCPEC 2018 - A Joint Conference of 45th IEEE PVSC, 28th PVSEC and 34th EU PVSEC

SP - 727

EP - 730

BT - 2018 IEEE 7th World Conference on Photovoltaic Energy Conversion, WCPEC 2018 - A Joint Conference of 45th IEEE PVSC, 28th PVSEC and 34th EU PVSEC

PB - Institute of Electrical and Electronics Engineers Inc.

T2 - 7th IEEE World Conference on Photovoltaic Energy Conversion, WCPEC 2018

Y2 - 10 June 2018 through 15 June 2018

ER -

Li H, Lv F. Study on failure models and degradation rate of PV aged modules in field in China. 在 2018 IEEE 7th World Conference on Photovoltaic Energy Conversion, WCPEC 2018 - A Joint Conference of 45th IEEE PVSC, 28th PVSEC and 34th EU PVSEC. Institute of Electrical and Electronics Engineers Inc. 2018. 页码 727-730. 8547795. (2018 IEEE 7th World Conference on Photovoltaic Energy Conversion, WCPEC 2018 - A Joint Conference of 45th IEEE PVSC, 28th PVSEC and 34th EU PVSEC). doi: 10.1109/PVSC.2018.8547795

Study on failure models and degradation rate of PV aged modules in field in China

摘要

出版系列

会议

联合国可持续发展目标

访问文件

其它文件与链接

指纹

引用此