Study on camera calibration method in plane mirror detection system

Chao Wang, Qiudong Zhu, Shanshan Wang

科研成果: 书/报告/会议事项章节会议稿件同行评审

摘要

Camera calibration is vital in inverse Hartmann system for measuring surface shape of large aperture plane mirrors. It directly affects system accuracy. Through calibration, the internal and external parameters of camera can be acquired. In order to increase the accuracy of camera calibration, this paper selects dot matrix pattern suitable for our system as calibration plate and applies centroid detection algorithm to extract position of feature points. The impact of number and diameter size of dots on camera calibration has been analyzed. Through experiment, the repeatability of the centroid detection algorithm for dot matrix reaches 0.004 pixels, while corner extraction algorithm for checkboard is only 0.007 pixels. It indicates that using dot matrix pattern to calibrate camera is better than using a checkboard in inverse Hartmann system.

源语言英语
主期刊名9th International Symposium on Advanced Optical Manufacturing and Testing Technologies
主期刊副标题Meta-Surface-Wave and Planar Optics
编辑Changtao Wang, Minghui Hong, Xiangang Luo, Xiong Li, Xiaoliang Ma, Mingbo Pu
出版商SPIE
ISBN(电子版)9781510623248
DOI
出版状态已出版 - 2019
活动9th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Meta-Surface-Wave and Planar Optics - Chengdu, 中国
期限: 26 6月 201829 6月 2018

出版系列

姓名Proceedings of SPIE - The International Society for Optical Engineering
10841
ISSN(印刷版)0277-786X
ISSN(电子版)1996-756X

会议

会议9th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Meta-Surface-Wave and Planar Optics
国家/地区中国
Chengdu
时期26/06/1829/06/18

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引用此

Wang, C., Zhu, Q., & Wang, S. (2019). Study on camera calibration method in plane mirror detection system. 在 C. Wang, M. Hong, X. Luo, X. Li, X. Ma, & M. Pu (编辑), 9th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Meta-Surface-Wave and Planar Optics 文章 108410M (Proceedings of SPIE - The International Society for Optical Engineering; 卷 10841). SPIE. https://doi.org/10.1117/12.2505879