Study on automatic test of the high-precision I/F converter

Ming Jie Dong*, Wang Bo, Zhi Feng Gao

*此作品的通讯作者

科研成果: 书/报告/会议事项章节会议稿件同行评审

摘要

A new method that uses the same clock signal between the frequency test system and the I/F converter is provided to avoid the frequency test error. The standard instruments such as FLUKE 5520A calibration and FLUKE 8508A 8 1/2 precision multimeter are used, that not only simplifies the design of the test system but also enhance reliability of the system. The RS232 bus and the GPIB bus are used to achieve the automatic test.

源语言英语
主期刊名Manufacturing Science and Technology
4906-4910
页数5
DOI
出版状态已出版 - 2012
活动2011 International Conference on Manufacturing Science and Technology, ICMST 2011 - Singapore, 新加坡
期限: 16 9月 201118 9月 2011

出版系列

姓名Advanced Materials Research
383-390
ISSN(印刷版)1022-6680

会议

会议2011 International Conference on Manufacturing Science and Technology, ICMST 2011
国家/地区新加坡
Singapore
时期16/09/1118/09/11

指纹

探究 'Study on automatic test of the high-precision I/F converter' 的科研主题。它们共同构成独一无二的指纹。

引用此