TY - GEN
T1 - Spatio-temporal mapping of transient electric fields with ultrafast scanning tunneling microscope
AU - Lan, Tian
AU - Ni, Guoqiang
PY - 2007
Y1 - 2007
N2 - In this paper, we report experimental results of spatio-temporal mapping of electrical transients scanned in strip direction with an ultrafast scanning tunneling microscope. The transients are pumped by ultrashort laser pulses with duration of 100 fs and a wavelength of 800 nm on a coplanar strip line sample. The signals on a coplanar strip line were measured in both contact and non-contact mode. The resolved transient signal showed a full width at half maximum (FWHM) pulse width of 1.2 ps. The pulses propagate along the CPS at a speed of about 2/3 of the light velocity. The spatial resolution image of the gold surface on the transmission line acquired with the tip by the STM under ambient condition has a resolution on the order of 20 nm.
AB - In this paper, we report experimental results of spatio-temporal mapping of electrical transients scanned in strip direction with an ultrafast scanning tunneling microscope. The transients are pumped by ultrashort laser pulses with duration of 100 fs and a wavelength of 800 nm on a coplanar strip line sample. The signals on a coplanar strip line were measured in both contact and non-contact mode. The resolved transient signal showed a full width at half maximum (FWHM) pulse width of 1.2 ps. The pulses propagate along the CPS at a speed of about 2/3 of the light velocity. The spatial resolution image of the gold surface on the transmission line acquired with the tip by the STM under ambient condition has a resolution on the order of 20 nm.
KW - Spatio-temporal mapping
KW - Transient measurements
KW - Ultrafast scanning tunneling microscope (USTM)
UR - http://www.scopus.com/inward/record.url?scp=34547957981&partnerID=8YFLogxK
U2 - 10.1115/mnc2007-21323
DO - 10.1115/mnc2007-21323
M3 - Conference contribution
AN - SCOPUS:34547957981
SN - 0791842657
SN - 9780791842652
T3 - Proceedings of the International Conference on Integration and Commercialization of Micro and Nanosystems 2007
SP - 1615
EP - 1620
BT - Proceedings of the International Conference on Integration and Commercialization of Micro and Nanosystems 2007
PB - American Society of Mechanical Engineers(ASME)
T2 - International Conference on Integration and Commercialization of Micro and Nanosystems 2007
Y2 - 10 January 2007 through 13 January 2007
ER -