摘要
A single-photon imaging system based on compressed sensing has been developed to image objects under ultra-low illumination. With this system, we have successfully realized imaging at the single-photon level with a single-pixel avalanche photodiode without point-by-point raster scanning. From analysis of the signal-to-noise ratio in the measurement we find that our system has much higher sensitivity than conventional ones based on point-by-point raster scanning, while the measurement time is also reduced.
源语言 | 英语 |
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页(从-至) | 3406-3411 |
页数 | 6 |
期刊 | Physics Letters, Section A: General, Atomic and Solid State Physics |
卷 | 378 |
期 | 45 |
DOI | |
出版状态 | 已出版 - 3 10月 2014 |
已对外发布 | 是 |