Single-frame dual-wavelength phase demodulation method based on deep learning

Chen Li, Weirui Zhao*

*此作品的通讯作者

科研成果: 书/报告/会议事项章节会议稿件同行评审

摘要

In dual-wavelength interferometry, how to accurately separate single-wavelength interferogram from a dual-wavelength interferogram and retrieve the high-precision phase distribution from a single frame interferogram is a critical problem. In order to solve this problem, a single frame dual-wavelength interferogram modulation method based on deep learning strategy is proposed in this paper. Dual-wavelength network (D-Net) and Phase network (P-Net) are proposed in this study. The method only requires a single frame dual-wavelength interferogram. With a well-trained D-Net network, the interferograms corresponding to the two different wavelengths can be extracted from the single frame dual-wavelength interferogram respectively, and are taken as the input of P-Net. P-Net outputs the wrapping phase of the two wavelengths, and then the dual wavelength phase can be obtained by unwrapping the wrap phase. Finally, the tested optical element surface shape can be obtained from the phase distribution. Furthermore, instead of using real experimental data, an interferogram generation model is constructed to generate the dataset for the network's training. The learning rate attenuation strategy adopting appropriate optimizers and loss functions is introduced to guarantee the high-accuracy training of the network. Simulations have been done to validate the feasibility of this algorithm. The simulations prove that this method can guarantee a high detection accuracy and expand detection range, which provides a solution for the phase recovery problem in dual wavelength interferometry.

源语言英语
主期刊名Optical Design and Testing XIII
编辑Yongtian Wang, Tina E. Kidger, Rengmao Wu
出版商SPIE
ISBN(电子版)9781510667792
DOI
出版状态已出版 - 2023
活动Optical Design and Testing XIII 2023 - Beijing, 中国
期限: 14 10月 202315 10月 2023

出版系列

姓名Proceedings of SPIE - The International Society for Optical Engineering
12765
ISSN(印刷版)0277-786X
ISSN(电子版)1996-756X

会议

会议Optical Design and Testing XIII 2023
国家/地区中国
Beijing
时期14/10/2315/10/23

指纹

探究 'Single-frame dual-wavelength phase demodulation method based on deep learning' 的科研主题。它们共同构成独一无二的指纹。

引用此